Determination of porous Silicon thermal conductivity using the “Mirage effect” method

Abstract

Mirage effect is contactless and non destructive method which has been used a lot to determine thermal properties of different kind of samples , transverse photothermal deflection PTD in skimming configuration with ccd camera and special programs is used to determine thermal conductivity of porous silicon ps film. Ps samples were prepared by electrochemical etching. Thermal conductivity with porosity changing was measured and the experiments result compared with theoretical results, and they were almost the same.