High Resolution Image with Multi-wall Carbon Nanotube Atomic Force Microscopy Tip (RESEARCH NOTE)

Abstract

In this paper, a simple and reproducible approach for attaching the multi-wall carbon nanotubes (MWNTs) to the apex of the atomic force microscope probe has been proposed. For this purpose, the dielectrophoresis method was applied due to its simple performance, cheapness and reliability. In this method, various parameters such as voltage, frequency, concentration of carbon nanotubes solution and tip's shape would affect the deposition of multi-walled carbon nanotubes on the probe of atomic force microscope. Here, specifically the voltage effect on the deposition of MWNTs onto the atomic force microscope tip has been investigated while the other parameters held constant. Our experiments revealed that when the frequency was held at 5 MHz and 1 µL of MWNTs solution injected, the optimum voltage between tip and electrode surface was 6 V.