نمایش مختصر رکورد

dc.contributor.authorRezaei, A.en_US
dc.date.accessioned1399-07-08T20:03:22Zfa_IR
dc.date.accessioned2020-09-29T20:03:22Z
dc.date.available1399-07-08T20:03:22Zfa_IR
dc.date.available2020-09-29T20:03:22Z
dc.date.issued2018-11-01en_US
dc.date.issued1397-08-10fa_IR
dc.date.submitted2016-11-07en_US
dc.date.submitted1395-08-17fa_IR
dc.identifier.citationRezaei, A.. (2018). Design and Test of New Robust QCA Sequential Circuits. International Journal of Nanoscience and Nanotechnology, 14(4), 297-306.en_US
dc.identifier.issn1735-7004
dc.identifier.issn2423-5911
dc.identifier.urihttp://www.ijnnonline.net/article_33277.html
dc.identifier.urihttps://iranjournals.nlai.ir/handle/123456789/80206
dc.description.abstract<em>   One of the several promising new technologies for computing at nano-scale is quantum-dot cellular automata (QCA). In this paper, new designs for different QCA sequential circuits are presented. Using an efficient QCA D flip-flop (DFF) architecture, a 5-bit counter, a novel single edge generator (SEG) and a divide-by-2 counter are implemented. Also, some types of oscillators, a new edge-triggered K-pulse generator (KPG) and a negative pulse generator (NPG) are presented for implementation in QCA. The robust layouts of proposed circuits are designed, implemented and simulated using QCADesigner software without any wire crossing. The fault effects at the output of proposed DFF due to the missing cell defects are analyzed. Also, the robustness of the proposed QCA designs with respect to temperature variations is examined. The proposed designs are compared with the previous QCA works and conventional CMOS technology. The simulation results confirm that the novel QCA architectures work properly and can be simply used in designing of QCA sequential circuits. </em>en_US
dc.format.extent1676
dc.format.mimetypeapplication/pdf
dc.languageEnglish
dc.language.isoen_US
dc.publisherIranian Nanotechnology Societyen_US
dc.relation.ispartofInternational Journal of Nanoscience and Nanotechnologyen_US
dc.subjectQuantum-dot cellular Automataen_US
dc.subjectQCADesigneren_US
dc.subjectSequential Circuitsen_US
dc.subjectSimulationen_US
dc.titleDesign and Test of New Robust QCA Sequential Circuitsen_US
dc.typeTexten_US
dc.typeResearch Paperen_US
dc.contributor.departmentDepartment of Electrical Engineering, Kermanshah University of Technology, Kermanshah, Iran.en_US
dc.citation.volume14
dc.citation.issue4
dc.citation.spage297
dc.citation.epage306


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