نمایش مختصر رکورد

dc.contributor.authorJafari, Aminen_US
dc.date.accessioned1399-07-09T08:09:23Zfa_IR
dc.date.accessioned2020-09-30T08:09:23Z
dc.date.available1399-07-09T08:09:23Zfa_IR
dc.date.available2020-09-30T08:09:23Z
dc.date.issued2015-02-01en_US
dc.date.issued1393-11-12fa_IR
dc.identifier.citationJafari, Amin. (2015). Size Effect on Free Transverse Vibration of Cracked Nano-beams using Couple Stress Theory. International Journal of Engineering, 28(2), 296-304.en_US
dc.identifier.issn1025-2495
dc.identifier.issn1735-9244
dc.identifier.urihttp://www.ije.ir/article_72457.html
dc.identifier.urihttps://iranjournals.nlai.ir/handle/123456789/336049
dc.description.abstractIn this paper, the transverse vibration of cracked nano-beam has been studied based on modified couple stress theory. Crack is modeled by a rotational spring that creates a discontinuity. Frequency equations of cracked nano-beam with some typical boundary conditions are derived and the frequency parameter for different crack positions, crack parameter and length scale parameters value are calculated. According to the results, it can be found that the effects of the crack parameter and crack location on transverse frequency of the cracked nano-beam are significant. In addition, scale effect parameter is one of the important parameter in nanoscale that must be obtained. Finally, the results of special cases show good agreement with the results available in the literature.en_US
dc.format.extent1167
dc.format.mimetypeapplication/pdf
dc.languageEnglish
dc.language.isoen_US
dc.publisherMaterials and Energy Research Centeren_US
dc.relation.ispartofInternational Journal of Engineeringen_US
dc.subjectCracked nanoen_US
dc.subjectBeamen_US
dc.subjectfrequency parameteren_US
dc.subjectcouple stress theoryen_US
dc.subjectsize effect parameteren_US
dc.titleSize Effect on Free Transverse Vibration of Cracked Nano-beams using Couple Stress Theoryen_US
dc.typeTexten_US
dc.contributor.departmentFaculty of Engineering, ShahreKord Universityen_US
dc.citation.volume28
dc.citation.issue2
dc.citation.spage296
dc.citation.epage304


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