نمایش مختصر رکورد

dc.contributor.authorAhangari, Zahraen_US
dc.contributor.authorFathipour, M.en_US
dc.date.accessioned1399-07-09T03:06:21Zfa_IR
dc.date.accessioned2020-09-30T03:06:21Z
dc.date.available1399-07-09T03:06:21Zfa_IR
dc.date.available2020-09-30T03:06:21Z
dc.date.issued2012-12-01en_US
dc.date.issued1391-09-11fa_IR
dc.date.submitted2014-05-14en_US
dc.date.submitted1393-02-24fa_IR
dc.identifier.citationAhangari, Zahra, Fathipour, M.. (2012). Impact of Silicon Wafer Orientation on the Performance of Metal Source/Drain MOSFET in Nanoscale Regime: a Numerical Study. Journal of Nanostructures, 2(4), 477-483. doi: 10.7508/jns.2012.04.010en_US
dc.identifier.issn2251-7871
dc.identifier.issn2251-788X
dc.identifier.urihttps://dx.doi.org/10.7508/jns.2012.04.010
dc.identifier.urihttps://jns.kashanu.ac.ir/article_5420.html
dc.identifier.urihttps://iranjournals.nlai.ir/handle/123456789/233720
dc.description.abstractA comprehensive study of Schottky barrier MOSFET (SBMOSFET) scaling issue is performed to determine the role of wafer orientation and structural parameters on the performance of this device within Non-equilibrium Green's Function formalism. Quantum confinement increases the effective Schottky barrier height (SBH). (100) orientation provides lower effective Schottky barrier height in comparison with (110) and (111) wafers. As the channel length of ultra thin body SBMOSFET scales down to nanoscale regime, especially for high effective SBHs, quantum confinement is created along the channel and current propagates through discrete resonance states. We have studied the possibility of resonant tunneling in SBMOSFET. Resonant tunneling for  (110) and (111) orientations appear at higher gate voltages.en_US
dc.languageEnglish
dc.language.isoen_US
dc.publisherUniversity of Kashanen_US
dc.relation.ispartofJournal of Nanostructuresen_US
dc.relation.isversionofhttps://dx.doi.org/10.7508/jns.2012.04.010
dc.subjectNanoscale Schottkyen_US
dc.subjectNon-equilibrium Green'sen_US
dc.subjectFunction (NEGF) formalismen_US
dc.subjectQuantum Transporten_US
dc.subjectResonant Tunnelingen_US
dc.titleImpact of Silicon Wafer Orientation on the Performance of Metal Source/Drain MOSFET in Nanoscale Regime: a Numerical Studyen_US
dc.typeTexten_US
dc.typeResearch Paperen_US
dc.contributor.departmentDepartment of Electrical Engineering, Science and Research Branch, Islamic Azad University, Tehran, Iranen_US
dc.contributor.departmentSchool of Electrical and Computer Engineering University of Tehran, Tehranen_US
dc.citation.volume2
dc.citation.issue4
dc.citation.spage477
dc.citation.epage483


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