نمایش مختصر رکورد

dc.date.accessioned1399-07-09T01:18:04Zfa_IR
dc.date.accessioned2020-09-30T01:18:04Z
dc.date.available1399-07-09T01:18:04Zfa_IR
dc.date.available2020-09-30T01:18:04Z
dc.date.issued2007-03-01en_US
dc.date.issued1385-12-10fa_IR
dc.identifier.citation(2007). Journal of Sciences, Islamic Republic of Iran, 18(1)en_US
dc.identifier.issn1016-1104
dc.identifier.issn2345-6914
dc.identifier.urihttps://jsciences.ut.ac.ir/article_30997.html
dc.identifier.urihttps://iranjournals.nlai.ir/handle/123456789/196234
dc.description.abstractX-ray diffraction measurements were performed on Co?Pt1-?/Pd, Co/Pd, Co/Fe, and Co/W multilayer samples with different structures, such as Co?Pt1-? alloy layer composition ?, bilayer thickness, and number of bilayers. Multilayer samples were made by magnetron sputtering in a chamber with multi-parallel guns and a position controllable substrate. Co?Pt1-? alloy layers were deposited by cosputtering from Co and Pt targets mounted on guns tilted towards a common substrate. Compositions of Co and Pt in Co?Pt1-? layers were varied by use of different sputtering power. The thicknesses of magnetic and non-magnetic layers in multilayered samples were also systematically changed to investigate the relationship between X-ray diffraction lines and crystalline structures of multilayered films. It was found that the position of the main diffraction peak from multilayered films was solely determined by the crystalline structures within bilayers rather than bilayer thickness. A model was introduced to calculate microstructural parameters such as the thickness of interfaces and compositions at interfaces.en_US
dc.format.extent190
dc.format.mimetypeapplication/pdf
dc.languageEnglish
dc.language.isoen_US
dc.publisherUniversity of Tehranen_US
dc.relation.ispartofJournal of Sciences, Islamic Republic of Iranen_US
dc.typeTexten_US
dc.citation.volume18
dc.citation.issue1


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