نمایش مختصر رکورد

An overview of scanning near-field optical microscopy in characterization of nano-materials

dc.contributor.authorSobat, Z.en_US
dc.contributor.authorSadegh Hassani, S.en_US
dc.date.accessioned1399-07-08T20:04:35Zfa_IR
dc.date.accessioned2020-09-29T20:04:35Z
dc.date.available1399-07-08T20:04:35Zfa_IR
dc.date.available2020-09-29T20:04:35Z
dc.date.issued2014-07-01en_US
dc.date.issued1393-04-10fa_IR
dc.date.submitted2013-07-31en_US
dc.date.submitted1392-05-09fa_IR
dc.identifier.citationSobat, Z., Sadegh Hassani, S.. (2014). An overview of scanning near-field optical microscopy in characterization of nano-materials. International Journal of Nano Dimension, 5(3), 203-212. doi: 10.7508/ijnd.2014.03.001en_US
dc.identifier.issn2008-8868
dc.identifier.issn2228-5059
dc.identifier.urihttps://dx.doi.org/10.7508/ijnd.2014.03.001
dc.identifier.urihttp://www.ijnd.ir/article_634137.html
dc.identifier.urihttps://iranjournals.nlai.ir/handle/123456789/80645
dc.description.abstractScanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of diverse SNOM methods mostly based on aperture and aperture-less is presented.en_US
dc.format.extent640
dc.format.mimetypeapplication/pdf
dc.languageEnglish
dc.language.isoen_US
dc.publisherIslamic Azad University-Tonekabon Branchen_US
dc.relation.ispartofInternational Journal of Nano Dimensionen_US
dc.relation.isversionofhttps://dx.doi.org/10.7508/ijnd.2014.03.001
dc.subjectScanning Near-Field Optical Microscopyen_US
dc.subjectScanning probe microscopeen_US
dc.subjectNano structuresen_US
dc.subjectOptical microscopyen_US
dc.subjectAperture less SNOMen_US
dc.subjectPhoton scanning tunneling microscopyen_US
dc.subjectOptical fiberen_US
dc.titleAn overview of scanning near-field optical microscopy in characterization of nano-materialsen_US
dc.typeTexten_US
dc.typeReviewen_US
dc.contributor.departmentCatalysis and Nanotechnology Research Division, Research Institute of Petroleum Industry, P. O. Box: 1485733111, Tehran, Iran.en_US
dc.contributor.departmentCatalysis and nanotechnology research division, research institute of petroleum industry, P. O. Box: 1485733111, Tehran, Iran.en_US
dc.citation.volume5
dc.citation.issue3
dc.citation.spage203
dc.citation.epage212


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