مرور Volume 1, Issue 3 بر اساس موضوع "Atomic Force Microscopy"
در حال نمایش موارد 1 - 1 از 1
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Studying of various nanolithography methods by using Scanning Probe Microscope
(Islamic Azad University-Tonekabon Branch, 2011-03-01)The Scanning Probe Microscopes (SPMs) based lithographic techniques have been demonstrated as an extremely capable patterning tool. Manipulating surfaces, creating atomic assembly, fabricating chemical patterns, imaging ...



