Ferrite material Characterization Using S-Parameters Data

Abstract

ince many applications rely on the knowledge of the electromagnetic <br />material properties of ferrites, such as ferrite phase shifters, this paper <br />presents an algorithm for characterizing ferrite materials in a single <br />frequency using a rectangular waveguide system. In this method, the <br />extraction of ferrite parameters is implemented through minimizing the <br />difference between the measured data and the results from modal <br />analysis of the system. The main advantage of this method compared to<br />the other ones is that the proposed method only needs the amplitude of <br />the reflection and transmission coefficients to estimate the parameters of <br />ferrite materials. This makes the implementation easy and eliminates the <br />problems associated with phase calibrations and measurements. This <br />validation is achieved by simulation and experimental tests. The <br />proposed algorithm is validated by characterizing YIG and SL-470 <br />ferrites.