نمایش مختصر رکورد

dc.date.accessioned1399-07-08T18:29:44Zfa_IR
dc.date.accessioned2020-09-29T18:29:44Z
dc.date.available1399-07-08T18:29:44Zfa_IR
dc.date.available2020-09-29T18:29:44Z
dc.date.issued2006-01-01en_US
dc.date.issued1384-10-11fa_IR
dc.date.submitted2005-11-29en_US
dc.date.submitted1384-09-08fa_IR
dc.identifier.citation(2006). Improving logic-level representation of taylor expansion diagram using attributed edges. Iranian Journal of Science and Technology Transactions of Electrical Engineering, 30(6), 735-748. doi: 10.22099/ijste.2006.878en_US
dc.identifier.issn2228-6179
dc.identifier.urihttps://dx.doi.org/10.22099/ijste.2006.878
dc.identifier.urihttp://ijste.shirazu.ac.ir/article_878.html
dc.identifier.urihttps://iranjournals.nlai.ir/handle/123456789/45375
dc.description.abstractFormal verification of complex digital systems requires a mechanism for efficient representation and manipulation of arithmetic as well as random Boolean functions. Although the Taylor Expansion Diagram can be used effectively to represent arithmetic expressions at the vector level, it is not efficient in the use of memory for representing bit-level logic expressions. In this paper, we present modifications to TED that will improve its ability for logic representation while maintaining its robustness in arithmetic representation. Our experimental results show a 30% reduction in the number of nodes in some benchmarks.en_US
dc.format.extent189
dc.format.mimetypeapplication/pdf
dc.languageEnglish
dc.language.isoen_US
dc.publisherShiraz Universityen_US
dc.relation.ispartofIranian Journal of Science and Technology Transactions of Electrical Engineeringen_US
dc.relation.isversionofhttps://dx.doi.org/10.22099/ijste.2006.878
dc.subjectFormal verificationen_US
dc.subjectTaylor expansion diagramen_US
dc.subjectattributed edgeen_US
dc.subjectregister transfer levelen_US
dc.titleImproving logic-level representation of taylor expansion diagram using attributed edgesen_US
dc.typeTexten_US
dc.citation.volume30
dc.citation.issue6
dc.citation.spage735
dc.citation.epage748


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