نمایش مختصر رکورد

dc.contributor.authorTohidi, S.Hen_US
dc.date.accessioned1399-07-09T08:08:51Zfa_IR
dc.date.accessioned2020-09-30T08:08:51Z
dc.date.available1399-07-09T08:08:51Zfa_IR
dc.date.available2020-09-30T08:08:51Z
dc.date.issued2011-07-01en_US
dc.date.issued1390-04-10fa_IR
dc.identifier.citationTohidi, S.H. (2011). Comparison Nanostructure Behaviour of Copper Species on the Silicamatrix Xerogels. International Journal of Engineering, 24(2), 147-153.en_US
dc.identifier.issn1025-2495
dc.identifier.issn1735-9244
dc.identifier.urihttp://www.ije.ir/article_71903.html
dc.identifier.urihttps://iranjournals.nlai.ir/handle/123456789/335865
dc.description.abstractThe incorporation of copper species is synthesized  in a silica matrix by the sol-gel method. We have doped copper ions and copper particles using two different copper sources: Cu(NO3)2.3H2O and copper particles chemically synthesized. We can prepare the particles of copper metallic, cuprous and cupric oxide and  compare the synthesis and characterization copper species on the silica matrix.  On this way, their structures  are analyzed by FT IR spectroscopy and XRD diffraction at  200,400 and 600°C temperatures. we have recognized three main region contain Rocking (R), Bending (B )and Stretching  (S)  on their structure using FT IR spectrum. Also, the SEM micrographs and chemical analysis are compared by EDX of Cu and CuO/SiO2 together. Average size of  particles was determinated about 150-200 nm  for copper particles and about 50 nm for copper ions by TEM micrograph.en_US
dc.format.extent271
dc.format.mimetypeapplication/pdf
dc.languageEnglish
dc.language.isoen_US
dc.publisherMaterials and Energy Research Centeren_US
dc.relation.ispartofInternational Journal of Engineeringen_US
dc.subjectSynthesisen_US
dc.subjectCharactrizationen_US
dc.subjectCopper Speciesen_US
dc.subjectNanocompositeen_US
dc.titleComparison Nanostructure Behaviour of Copper Species on the Silicamatrix Xerogelsen_US
dc.typeTexten_US
dc.contributor.departmentMaterial, Material Research School, Nuclear Science and Techen_US
dc.citation.volume24
dc.citation.issue2
dc.citation.spage147
dc.citation.epage153


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