نمایش مختصر رکورد

dc.contributor.authorAshoor, M.en_US
dc.date.accessioned1399-07-08T21:53:09Zfa_IR
dc.date.accessioned2020-09-29T21:53:10Z
dc.date.available1399-07-08T21:53:09Zfa_IR
dc.date.available2020-09-29T21:53:10Z
dc.date.issued2006-01-01en_US
dc.date.issued1384-10-11fa_IR
dc.date.submitted2006-08-12en_US
dc.date.submitted1385-05-21fa_IR
dc.identifier.citationAshoor, M.. (2006). Performance Analysis of Time-Hopping Ultra-Wideband Systems in Multipath Fading Channels (Uncoded and Coded Schemes). Scientia Iranica, 13(1)en_US
dc.identifier.issn1026-3098
dc.identifier.issn2345-3605
dc.identifier.urihttp://scientiairanica.sharif.edu/article_2564.html
dc.identifier.urihttps://iranjournals.nlai.ir/handle/123456789/120181
dc.description.abstractIn this paper, the performances of both uncoded and coded multiple access TH-UWB systems, introduced in [1-3] in multipath Rayleigh fading channels, are evaluated. The receiver is a selective diversity combining receiver, known as SRake. Based on a Gaussian distribution assumption for the multiple access interference at the output of the SRake receiver and by using a virtual branch technique, as introduced in [4,5], the bit error rates for uncoded and coded schemes are derived. The performance analysis shows that the effective order of diversity achieved by the coded scheme is the product of the number of branches of the SRake receiver and the Hamming distance of the code applied. Furthermore, the results indicate that the coded scheme significantly outperforms the uncoded scheme without requiring any extra bandwidth, further than what is required by the uncoded system.en_US
dc.format.extent583
dc.format.mimetypeapplication/pdf
dc.languageEnglish
dc.language.isoen_US
dc.publisherSharif University of Technologyen_US
dc.relation.ispartofScientia Iranicaen_US
dc.titlePerformance Analysis of Time-Hopping Ultra-Wideband Systems in Multipath Fading Channels (Uncoded and Coded Schemes)en_US
dc.typeTexten_US
dc.contributor.departmentDepartment of Electrical Engineering,Sharif University of Technologyen_US
dc.citation.volume13
dc.citation.issue1


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